EE 658 Diagnosis and Design of Reliable Digital Systems

Units: 4
Terms Offered: Fa

Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies; search techniques; memory testing.
Recommended Preparation: EE 477, EE 457
Instruction Mode: Lecture
Grading Option: Letter

Crosslisted as CSCI 658